This instrument uses the phenomenon of quantum mechanical electron tunneling between a sharp metallic tip
and a flat sample separated by a distance of about 0.5 nm. The electron tunneling current (It) depends exponentially
on the distance between the tip and sample (d) which makes It very sensitive to small changes in d. It ~ exp(-kd) where k is related to the work function.
Click on image to see the imaging mode
The high sensitivity of the tunnel current to the tip-sample distance results in the high spatial resolution of the STM.
Some examples are shown below: