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All AFM and EFM images have been acquired with a ThermoMicroscopes instrument using a CP Research Head
1 Comparison scans, using conventional and nanotube modified tips, of a linear array of phototresist lines
2 SEM micrograph of a carbon nanotube modified cantilever
3 Comparison of topographical (AFM)  and surface potential scans (EFM)
4 Topographical (AFM) and surface potential (EFM) scans of voltage biased tunnel junctions taken with both conventional and nanotube tips.
5
Simultaneously acquired scans of topography (AFM) and surface potential (EFM) of a silver film grown in the coalescence (percolation) regime.