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scale image with description.
All AFM and EFM images have been acquired
with a ThermoMicroscopes instrument using a CP Research Head
1 |
Comparison scans,
using conventional and nanotube modified tips, of a linear array of phototresist
lines |
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2 |
SEM micrograph of a carbon nanotube
modified cantilever |
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3 |
Comparison of topographical (AFM)
and surface potential scans (EFM) |
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4 |
Topographical (AFM) and surface
potential (EFM) scans of voltage biased tunnel junctions taken with both
conventional and nanotube tips. |
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5
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Simultaneously acquired scans
of topography (AFM) and surface potential (EFM) of a silver film grown
in the coalescence (percolation) regime.
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