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Sheng Li - Research in the Semiconductor Characterization Lab and Semiconductor Optical Lab concentrate on the defect and interface characterization of silicon-on-insulator (SOI) materials and devices. Others improve high speed and optoelectronic devices. Another area of research deals with quantum-well infrared photodetectors for long wavelength staring focal plane imaging array applications. A multi-discipline research program is concerned with the development of high efficiency thin film InCuSe2 solar cells.