Radiation tests of UF/PNPI CMS ME CSC HV system, Distribution board
Oct 2003
All tests were done under full voltage (4KV input, 3800V output on all channels)
Test log:
|
Run |
Dose |
Current |
Target |
Result |
|
1 |
100 Rad |
10 pA |
Around channels 1,2,3 |
OK |
|
2 |
5 kRad |
50 pA |
Around channels 1,2,3 |
OK |
|
3 |
5 kRad |
100 pA |
Around channels 5,6,7 |
OK |
|
4 |
5 kRad |
100 pA |
DAC + ADC+ logic around |
OK |
|
5 |
5 kRad |
100 pA |
Analog Multiplexor, channel 6 and around |
OK |
|
6 |
5 kRad |
100 pA |
Digital interface |
OK |
|
7 |
5 kRad |
100 pA |
Test pulse generator |
OK |
|
8 |
5 kRad |
100 pA |
LV regulators |
OK |
|
9 |
5 kRad |
100 pA |
Along the board, in the area of LV regulators (covers all channels in lower part of the board and all digital logic in that part) |
OK |
|
10 |
5 kRad |
100 pA |
Along the board, in the area of LV regulators (covers all channels in lower part of the board and all digital logic in that part) |
OK |
|
11 |
5 kRad |
100 pA |
Along the board, in the area of LV regulators (covers all channels in lower part of the board and all digital logic in that part) |
OK |
|
12 |
5 kRad |
100 pA |
Along the board, in the area of channel 1 (covers all channels in upper part of the board and all digital logic in that part) |
OK |
|
13 |
5 kRad |
100 pA |
Along the board, in the area of channel 1 (covers all channels in upper part of the board and all digital logic in that part) |
OK |
Conclusions:
1. No permanent damage of any kind detected.
2. Single event upsets are visible at high rates, but since we don’t have any programmable logic, the system recovers immediately (on the next clock). The software will ignore such upsets.
3. All tests were done with the board and components completely powered and parameters were monitored during and after the test.